NanoSeeX English

CES團隊簡介

The guardian of the front-end semiconductor critical dimension quality. The metrology tool can measure the N2 semiconductor process multilayer GAA structure and monitor critical dimensions with atomic-level resolution. Compared with its competitors, the tool has reduced measurement time by 90%. The target market includes foundry and memory below semiconductor N2 node. The market is expected to be USD 130 million in 2025, with an annual growth rate of 36.8%.

CES 2022 攤位號碼

61837

CES 2022 攤位領域

B

聯繫方式

聯絡人:Chun-Ting

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itriA60470@itri.org.tw
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CES 2022 獲獎紀錄

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The guardian of the front-end semiconductor critical dimension quality. The metrology tool can measu…

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